DI-NUOR-80929B

Nuclear Survivability Test Report

The Nuclear Survivability Test Report documents the results of nuclear survivability testing performed on systems, subsystems, structures, circuits, components, materials, and piece parts, providing the engineering evaluation of the system's nuclear survivability.

Approval DateFebruary 1, 2013

AMSC NumberF9320

Preparing Activity27 (AFNWC)

Project Number—

OPR—

DTIC Applicable—

GIDEP Applicable—

Limitation—

Applicable Forms—

Approval Limitation—

Form Version—

DID Formatdd_form_1664

963C CompliantNo

DISTRIBUTION STATEMENT A: Approved for public release; distribution is unlimited.

Supersedes

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DI-NUOR-80928

Description & Purpose

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Application & Interrelationship

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Use & Relationship

The Nuclear Survivability Test Report shall document the results of nuclear survivability test performed on systems, subsystems, structures, circuits, components, materials, and piece parts and provide the engineering evaluation of the system's nuclear survivability.

a. When a solicitation or contract contains a requirement to demonstrate compliance with nuclear survivability requirements, this Data Item Description (DID) shall be listed on the Contract Data Requirements List (DD Form 1423). The documents cited in this DID are to be used for guidance and are not mandatory for the CDRLs.

b. This DID contains the format and content preparation instructions for the data product generated by the specific and discrete task requirements as delineated in the contract.

c. When this DID is imposed in a solicitation or contract, DI-NUOR-80928, Nuclear Survivability Test Plan, shall also be listed on the DD Form 1423.

(Copies of the DID are available online at https://assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Ave., Bldg 4D, Philadelphia PA 19111-5094.)

d. Air Force Instruction (AFI) 10-2607, Air Force Chemical, Biological, Radiological, and Nuclear (CBRN) Survivability, contains the AF policy applicable to nuclear survivability.

(Copies of the AF Instruction are available online at http://www.e-publishing.af.mil/.)

e. The DD Form 1423 shall also list the Defense Threat Reduction Information Analysis Center (DTRIAC), 1680 Texas St., SE, Kirtland AFB NM 87117-5669 or e-mail [email protected], as a recipient for the report. DTRIAC serves as a DoD wide archive for nuclear survivability purposes.

f. A separate copy of the Special Data (see 3.4) shall be provided to DTRIAC (see e. above).

Preparation Instructions

1Reference documents.The applicable issue of the documents cited herein, including their approval dates and dates of any applicable amendments, notices and revisions, shall be as specified in the solicitation or contract.

2Format.The Nuclear Survivability Test Report shall be in contractor's format.

3General:The Nuclear Survivability Test Report shall contain all the data and conclusions resulting from the test(s) delineated in the current revision of DI-NUOR-80928 and shall include the following information:

3.1Specific data described in the report.

3.1.1Documentation with raw data of the pre- and post-exposure measurements on the piece parts, materials, components, circuits, structures, subassemblies, assemblies, and systems tests.There shall be particular emphasis on identifying and reporting the test results for the hardness critical items (HCI) or hardness critical process (HCP) and the mission essential equipments.

3.1.2The report shall document the test conditions for these measurements, including the ambient conditions, the instrumentation for the measurements, the monitor points, the time relation of the measurements with respect to the test level, modes and conditions of the test sample function during the test level and during the measurements, physical orientations of the test samples to the test environment (for system level tests, these include the Government and contractor furnished equipment), time after exposure that the measurements are made and the measurements of the simulated environments.

3.1.3The report shall provide a statement of how the simulated environments were measured; where, with respect to the sample, the measurements were made and what devices or instruments were used.

3.1.4A detailed description of the instrumentation calibration procedures and dosimetry shall be provided.

3.1.5Detailed test data sheets for each test level with the concurrence signatures of the Government observers and the contractors shall be provided by the contractor in this report.

3.1.6The report shall list the applicable methods of MIL-STD-750 and MIL-STD-883 methods used to design the tests on semiconductor piece parts.(Copies of MIL-STDs-750 and -883 are available online at https://assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Ave., Bldg 4D, Philadelphia PA 19111-5094.)

3.2System test operational data described in the report:

3.2.1For system level tests, the report shall specify the system operational steps used to set up the system for tests.

3.2.2The report shall detail the equipment post-exposure status and the procedures used to restore the system to full function after the exposure.

3.3Data analysis described in the report:

3.3.1The report shall provide an analysis for the acceptability of the test data.

3.3.2As appropriate, a detailed description shall be provided of how the response information on piece parts, materials, components, circuits, structures, subassemblies and assemblies is analyzed to arrive at an evaluation of the system survivability, to include the operational impact of the system's nuclear response, error budgets and the specification for the allowable downtime.

3.3.3Details shall be provided for the calculations and analysis for the interpolation or extrapolation of the test data to determine how the system responds to the specified criteria.Computer analysis codes used in the analysis shall be named and referenced. All configurations, vehicles, and enclosures for these equipments shall be included in the nuclear survivability evaluations.

3.3.4In the data analysis discussions, the assumptions, opinions and judgments made to support the conclusions shall be clearly identified.

3.4Special data for electronic parts.The test report(s) shall provide the data listed below for the neutron, ionizing radiation dose and ionizing dose-rate responses of electronic piece parts. A copy of this data is to be provided in digital form to DTRIAC as specified (see e and f. above).

3.4.1Description of device tested.

3.4.1.1Type number to include complete MIL-STD part designations, as appropriate (e.g., 2N2930 JTX, M38510/00101BAC), and generic or Joint Electron Device Engineering Council (JEDEC) equivalent number.

3.4.1.2For non-standard devices, the closest generic or JEDEC part number.

3.4.1.3Device class (for example, zener diode, low-power transistor, or linear or digital integrated circuit).

3.4.1.4Manufacturer.

3.4.1.5Device test sequence identification number.

3.4.1.6Manufacturer's lot number, if available, and lot type, i.e., wafer, diffusion or inspection.

3.4.1.7Date code or purchase date.

3.4.1.8Number of samples tested.

3.4.1.9Governing electrical specifications.

3.4.1.10Package type.

3.4.2Neutron and ionizing radiation dose effects data.

3.4.2.1Pre-and post irradiation parameters measured, operating points (for example, hFE with IC and VCE operating points), time between irradiation and measurement, condition of devices between irradiation and measurement (i.e., temperature, mobile bias fixture, time unbiased and applied voltages) and time between consecutive measurements.

3.4.2.2Test facility (e.g., reactor, White Sands Missile Range, Survivability and Vulnerability Directorate or Febatron 706.).

3.4.2.3Test date.

3.4.2.4Bias conditions applied during irradiation.

3.4.2.5Irradiation temperature and test temperature.

3.4.2.6Test data for each piece part at each radiation level.

3.4.2.7Ionizing radiation dose (rad(si)) or neutron fluence (n/cm2 (1 MeV equivalent damage in Si)).For ionizing radiation dose measurements, the radiation type, dose rate and energy and the duration of the irradiation(s) must be specified.

3.4.2.8Applicable MIL-STD methods.

3.4.2.9Exposure circuitry and configuration, giving details of materials, distances, designs and applied voltages.

3.4.2.10Parameter and failure measurement apparatus and circuitry.

3.4.2.11Dosimetry methods and applicable ASTM standards.

3.4.2.12Remarks/comments - relevant information to explain or clarify test conditions or data.

3.4.2.13Anomalous incidents or data.

3.4.2.14Post-irradiation effects response data for the ionizing radiation dose.

3.4.3Ionizing dose-rate effects data.

3.4.3.1Same information as 3.4b, excluding items 7 and 14.

3.4.3.2Pulse with full width half maximum and pulse shape.

3.4.3.3Photocharge in coulombs or peak primary photocurrent in milliamperes.

3.4.3.4Cumulative dose in rad(Si) and dose rate in rad(Si)/second.

3.4.3.5As applicable, upset or latchup threshold data

3.4.4Data Summary

3.4.4.1Calculated means and standard deviation for each lot sample.

3.4.4.2The aggregate means and standard deviations for the combined lots.

3.4.4.3The 90 percent probability, 90 percent confidence limit of response data.

3.4.5General Information

3.4.5.1Name and address of company taking data.

3.4.5.2Person(s) responsible for tests and data records

3.4.5.3Phone number for point of contact to include area code and extension.

3.4.5.4Any identifier(s) that will assist in locating data such as lab book numbers.

References

Copies of the AF Instruction are available online at http://www.e-publishing.af.mil/

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