DI-QCIC-80887
Custom Microcircuit Characterization Report
The Custom Microcircuit Characterization Report documents the data to be supplied in support of the characterization requirements for custom integrated circuits and hybrid microcircuits.
Approval DateAugust 3, 1989
AMSC NumberG4797
Preparing Activity—
Project Number—
OPRG/Y253
DTIC Applicable—
GIDEP Applicable—
Limitation—
Applicable Forms—
Approval Limitation—
Form VersionMAR 87
DID Formatdd_form_1664
963C CompliantNo
DISTRIBUTION STATEMENT A: Approved for public release; distribution is unlimited.
Description & Purpose
3.1 This report documents the data to be supplied in support of the requirements for the characterization of both custom integrated circuits and hybrid microcircuits.
Application & Interrelationship
7.1 This Data Item Description (DID) contains the format and content preparation instructions for the data product generated by the specific and discrete task requirement as delineated in the contract.
7.2 The term microcircuit or custom microcircuit, as used in this data item description, shall refer to both custom integrated circuits and hybrid microcircuits.
Preparation Instructions
10.1Format.The plan may be in the contractor's format.
10.2Content.The report shall contain the following:
10.2.1Title Page.The title page for the characterization report shall contain:
10.2.1.2Contractor's name
10.2.1.3Equipment or purchase description identification
10.2.1.4Date of preparation
10.2.1.6Custom Microcircuits covered by the report
10.2.1.7Security classification
10.2.2Schmoo Plots.Schmoo plots shall be generated to chart the device operating region with respect to the following parameters at the devices specified lower temperature limit, 25 degree centigrade, and specified upper temperature limit. A minimum of 10 points along each parameter shall be chosen. Four points shall be in the specified operating region, such that the area will contain a total of 16 data points. Sample size shall be indicated. Data points which indicate failures shall be identified with a different character than those points which do not indicate failures.
10.2.2.1Supply voltage vs. clock frequency
10.2.2.2Clock pulse width (duty cycle vs. clock voltage)
10.2.2.3Quiescent current vs. supply voltage
10.2.2.4Dynamic current vs. supply voltage
10.2.2.5Dynamic current vs. frequency
10.2.3Discussion Section.This section shall describe the test setup and point out any important details and problems encountered.
10.2.4Conclusion.The conclusion section shall give the contractor's final judgment as to whether the data presented has shown that the parts meet the specified operating requirements.
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