DI-SESS-82322

Built-In-Test Fault Tree

Specifies the format and content for a Built-In-Test Fault Tree, a graphical or tabular representation of the chain of faults used to report a system failure on a platform.

Approval DateJune 15, 2020

AMSC NumberN10187

Preparing ActivitySH

Project NumberSESS-2020-023

OPR—

DTIC ApplicableNo

GIDEP ApplicableNo

Limitation—

Applicable Forms—

Approval Limitation—

Form Version—

DID Formatfree_text

963C CompliantYes

DISTRIBUTION STATEMENT A: Approved for public release; distribution is unlimited.

Supersedes

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Description & Purpose

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Application & Interrelationship

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Use & Relationship

The Built-In-Test (BIT) Fault Tree (BFT) is a graphical or tabular representation of the chain of faults that will provide the Government with the reporting of a system failure on a platform.

This DID contains the format, content, and intended use information for the data deliverable and is applicable to the acquisition of all military systems, subsystems, and equipment.

Preparation Instructions

1Reference documentsThe applicable issue of the documents cited herein, including their approval dates and dates of any applicable amendments, notices, and revisions, shall be as specified in the contract.

2FormatThe Built-In-Test Fault Tree shall be in Contractor format.

3ContentThis Built-In-Test Fault Tree identifies the tests performed in order for Built-In-Test to detect and then isolate a failure to an individual system, subsystem, Weapon Replaceable Assembly (WRA), or Line Replaceable Unit (LRU). The BFT also identifies the Maintenance Code that is associated with the isolated assembly. The BFT shall include:

3.1All BIT tests that are performed in order to detect failures are identified

3.2All combinations of BIT test results, both failures and passesAll combinations of BIT test results, both failures and passes, which are used to isolate to an individual Operational Equipment assembly (system, subsystem, WRA, or LRU) are identified.

3.3All BIT isolated Operational Equipment assembly failuresAll BIT isolated Operational Equipment assembly failures are linked to their corresponding platform maintenance code.

3.4Administrative informationClassified information shall not be listed in the BFT.

3.5The BFT shall be structured as follows

3.5.1Cover pageThe cover page shall include descriptive information such as system or program name, contract number, contractor's company name, current revision, date of submittal, Contract Data Requirements List (CDRL) number.

3.5.2IntroductionThis section contains general information, remarks or other information about the system that the preparer feels would be beneficial.

3.5.3BIT Fault TreeThis section is a graphical or tabular representation of the BIT tests performed to detect and isolate failures. The BIT Fault Tree also links the isolated failed assembly to the corresponding platform maintenance code. The BIT Fault Tree is prepared as follows:

3.5.3.1BIT Fault Tree HeaderThis precedes the graphical/tabular representation and lists the following:

3.5.3.1.1Program Name

3.5.3.1.2System Model/Type Designation

3.5.3.1.3Date

3.5.3.1.4Version

3.5.3.2PlatformThese columns identify the platform, maintenance code, and maintenance code name associated with the BIT Isolated Operational Equipment.

3.5.3.3BIT Isolated Operational Equipment Model NameThis column lists the model name of the BIT isolated assembly.

3.5.3.4Operational Equipment BIT Test Fail/PassThese columns identify the nomenclature, model name, and reference designation (REF DES) of the system/subsystem/WRA/LRU that is tested along with the test results, fail or pass, of an individual BIT test identified in the BIT Algorithm columns.

3.5.3.5BIT AlgorithmThese columns identify the BIT test number and test name of the performed test.

3.5.4Sample BFT Template follows

References

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