DI-SESS-82539
Built-In-Test (BIT) Anomaly Reporting
Describes the format and content for a Built-In-Test (BIT) Anomaly Report used to assess system health, diagnostic performance, and configuration-specific reliability during production, induction, and recertification testing.
Approval DateMay 5, 2026
AMSC NumberN10660
Preparing ActivityAS
Project NumberSESS-2026-023
OPR—
DTIC Applicable—
GIDEP Applicable—
Limitation—
Applicable Forms—
Approval Limitation—
Form Version—
DID Formatfree_text
963C CompliantYes
DISTRIBUTION STATEMENT A: Approved for public release; distribution is unlimited.
Application & Interrelationship
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Use & Relationship
The BIT Anomaly Report is used to assess system health, diagnostic performance, and configuration-specific reliability during production acceptance testing, post-fielding induction, and recertification testing. The reported data supports failure reporting, analysis, and corrective action processes (e.g., FRACAS); verification of system readiness for fielding or return to service; and identification of trends related to manufacturing defects, maintenance-induced faults, and recurring failure modes. The data is also used to evaluate BIT effectiveness, including fault detection and isolation capability, and to inform safety, airworthiness, and sustainment decisions. BIT anomaly data shall be traceable to specific hardware and software configurations to enable correlation with test results, maintenance actions, and corrective actions.
This DID contains the format, content, and intended use information for the data product resulting from the work task described in the contract SOW.
Preparation Instructions
1Reference documentsThe applicable issue of the documents cited herein, including their approval dates and dates of any applicable amendments, notices, and revisions, shall be as specified in the contract.
2FormatThe report shall be in contractor's format.
3ContentFor each configuration item being reported, the report shall contain the following for each BIT occurrence:
3.1Unique anomaly identifier
3.2Date and time of occurrence
3.3Test phase (Production, Induction, Recertification)
3.4BIT type (PBIT, CBIT, IBIT)
3.5Fault code and description
3.6Affected configuration item (part number, serial number, lot number)
3.7Software/firmware version and configuration baseline
3.8Operating conditions and test configuration
3.9Severity/impact assessment
3.10Occurrence count or recurrence status
3.11Disposition status (open, under investigation, closed)
3.12Linkage to deficiency reports, FRACAS, or corrective actions as applicable
Schema v3.0Community-maintained · Verify against ASSIST